Greetings,
It occurs to me that some of the same defect =
structure
Randall speaks of would also occur in electronic components. A =
capacitive
plate for instance has finite dimension and spacing but any edge or =
surface
defect provides a non-linearity with any expansion or contraction of the =
plate
or the dielectric. A defect migration on the surface would also =
alter the
result. A solution in my opinion would be a multiple sensor =
configuration
with internal function similar to the method Brett and others use to =
measure
noise levels between two instruments by computing a coherent and a noise =
signal
for each. Depending on the numbers of sensors in the box so =
to
speak the computed coherent output would have a statistical confidence =
level.
Randy